ESD Stereo Zoom Microscope JBM-PL40

Industry Detection
Indispensable testing tool, widely applied for surface detection of PCB, SMT, semiconductor chip, metal material and precision components.

Specification:

• Binocular Head: 45° inclined 360°rotate
• Interpupillary Distance Adjustment: 54-75mm
• Diopter adjustment: ±5dp
• Eyepiece: PL10X/22mm
• Zoom Objective: 0.67x-4.5x
• Zoom Ratio: 1:6.7
• Magnification: 6.7X-45X Working Distance: 110mm